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"A PVT resilient short-time measurement solution for on-chip testing."
Esrafil Jedari, Rashid Rashidzadeh, Mehrdad Saif (2018)
- Esrafil Jedari, Rashid Rashidzadeh, Mehrdad Saif:
A PVT resilient short-time measurement solution for on-chip testing. Microelectron. J. 75: 35-40 (2018)
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