"Ruggedness analysis of 3.3 kV high voltage diodes considering various ..."

Birk Heinze et al. (2008)

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DOI: 10.1016/J.MEJO.2007.11.023

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type: Journal Article

metadata version: 2023-09-30

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Birk Heinze, Josef Lutz, Hans Peter Felsl, Hans-Joachim Schulze:
Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations. Microelectron. J. 39(6): 868-877 (2008)

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