"Wavelet decomposition and reconstruction-based INL method for testing ..."

Xiaohui Guo et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105945

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type: Journal Article

metadata version: 2024-05-07

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Xiaohui Guo, Xu Yan, Shimin Ma, Xinyi Zhang, Ziaho Yan, Anqi Zhang, Kai Xu, Liangping Hua, Yan Du, Hao Wang, Yuxin Shu, Weiqiang Hong, Yunong Zhao, Yaohua Xu:
Wavelet decomposition and reconstruction-based INL method for testing high-precision ADC. Microelectron. J. 142: 105945 (2023)

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