"Improving reliability in NoCs by reconstructing location distribution of ..."

Fangfa Fu et al. (2019)

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DOI: 10.1016/J.MEJO.2019.06.001

access: closed

type: Journal Article

metadata version: 2022-09-29

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Fangfa Fu, Binglei Lou, Yukun Chen, Jinxiang Wang:
Improving reliability in NoCs by reconstructing location distribution of management cores. Microelectron. J. 90: 133-140 (2019)

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