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"The temperature mobility degradation influence on the zero temperature ..."

L. M. Camillo et al. (2006)

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DOI: 10.1016/J.MEJO.2006.01.008

access: closed

type: Journal Article

metadata version: 2023-09-30

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L. M. Camillo, João Antonio Martino, Eddy Simoen, Cor Claeys:
The temperature mobility degradation influence on the zero temperature coefficient of partially and fully depleted SOI MOSFETs. Microelectron. J. 37(9): 952-957 (2006)

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