"On-chip weak resistive defect diagnosis with performance enhancement in 45 ..."

Sheetal Barekar, Madan Mali (2021)

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DOI: 10.1016/J.MEJO.2021.105178

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type: Journal Article

metadata version: 2021-09-01

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Sheetal Barekar, Madan Mali:
On-chip weak resistive defect diagnosis with performance enhancement in 45 nm technology static random access memory. Microelectron. J. 115: 105178 (2021)

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