"A 65-nm duty-cycle corrector achieving 10% to 90% duty-correction range ..."

Muhammad Abrar Akram et al. (2024)

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DOI: 10.1016/J.MEJO.2024.106267

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type: Journal Article

metadata version: 2024-08-22

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Muhammad Abrar Akram, Ibrar Ali Wahla, Bo-Hyeon Lee, In-Chul Hwang:
A 65-nm duty-cycle corrector achieving 10% to 90% duty-correction range with 0.86% duty-cycle error. Microelectron. J. 150: 106267 (2024)

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