"A Cross-Layer Technology-Based Study of How Memory Errors Impact System ..."

Veit Kleeberger et al. (2013)

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DOI: 10.1109/MM.2013.67

access: closed

type: Journal Article

metadata version: 2021-07-25

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  - https://dblp.org/rec/journals/micro/KleebergerGWHMNSW13
Veit Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller-Gritschneder, Sani R. Nassif, Ulf Schlichtmann, Norbert Wehn:
A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience. IEEE Micro 33(4): 46-55 (2013)

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