"Fatigue damage monitoring."

Ian R. Whitworth, J. Thickpenny (1980)

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DOI: 10.1016/0141-9331(80)90324-5

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ian R. Whitworth, J. Thickpenny:
Fatigue damage monitoring. Microprocess. Microsystems 4(7): 263-266 (1980)

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