"Closing the gap between speed and configurability of multi-bit fault ..."

Ralph Nyberg et al. (2015)

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DOI: 10.1016/J.MICPRO.2015.05.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ralph Nyberg, Johann Heyszl, Dirk Rabe, Georg Sigl:
Closing the gap between speed and configurability of multi-bit fault emulation environments for security and safety-critical designs. Microprocess. Microsystems 39(8): 1119-1129 (2015)

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