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"Design for testability of a 32-bit TRON microprocessor."

Yasuyuki Nozuyama, Akira Nishimura, Jun Iwamura (1989)

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DOI: 10.1016/0141-9331(89)90030-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mam/NozuyamaNI89
Yasuyuki Nozuyama, Akira Nishimura, Jun Iwamura:
Design for testability of a 32-bit TRON microprocessor. Microprocess. Microsystems 13(1): 17-27 (1989)

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