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"Bargain for testability researchers: Tsui, F FLSI/VLSI testability design ..."

Colin Maunder (1987)

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DOI: 10.1016/0141-9331(87)90059-7

access: closed

type: Journal Article

metadata version: 2020-02-22

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Colin Maunder:
Bargain for testability researchers: Tsui, F FLSI/VLSI testability design McGrawHill, New York, NY, USA (1987) £49.95 pp 702. Microprocess. Microsystems 11(9): 519 (1987)

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