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"Calculation of probabilistic testability measures for digital circuits ..."

Lembit Jürimägi et al. (2020)

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DOI: 10.1016/J.MICPRO.2020.103117

access: closed

type: Journal Article

metadata version: 2020-10-08

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Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik:
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs. Microprocess. Microsystems 77: 103117 (2020)

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