"Test pattern generation using thermometer code counter in TPC technique ..."

K. Jamal, Kamsali Manjunatha Chari, P. Srihari (2019)

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DOI: 10.1016/J.MICPRO.2019.102890

access: closed

type: Journal Article

metadata version: 2020-03-19

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K. Jamal, Kamsali Manjunatha Chari, P. Srihari:
Test pattern generation using thermometer code counter in TPC technique for BIST implementation. Microprocess. Microsystems 71 (2019)

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