"Automatic testing and evaluation of digital integrated circuits: J T ..."

Joe Gallacher (1981)

> Home

Details and statistics

DOI: 10.1016/0141-9331(81)90589-5

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mam/Gallacher81b
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mam/Gallacher81b
Joe Gallacher:
Automatic testing and evaluation of digital integrated circuits: J T Healy, Reston (1981) 236 pp £14.25. Microprocess. Microsystems 5(6): 258-259 (1981)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.