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"The application and use of boundary scan: Bleeker, H, van den Eijnden, P ..."
Anthony P. Ambler (1993)
- Anthony P. Ambler:
The application and use of boundary scan: Bleeker, H, van den Eijnden, P and de Jong, FBoundary-scan test - a practical approach Kluwer Academic (1992) ISBN 0 7923 9296 5, £50.75, pp 222. Microprocess. Microsystems 17(5): 305 (1993)
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