"Improved transformed deviance statistic for testing a logistic regression ..."

Nobuhiro Taneichi, Yuri Sekiya, Jun Toyama (2011)

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DOI: 10.1016/J.JMVA.2011.04.010

access: open

type: Journal Article

metadata version: 2021-02-17

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Nobuhiro Taneichi, Yuri Sekiya, Jun Toyama:
Improved transformed deviance statistic for testing a logistic regression model. J. Multivar. Anal. 102(9): 1263-1279 (2011)

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