"Progressive Hierarchical Deep Reinforcement Learning for defect wafer test."

Meng Xu et al. (2024)

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DOI: 10.1016/J.KNOSYS.2024.111832

access: closed

type: Journal Article

metadata version: 2024-07-19

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Meng Xu, Xinhong Chen, Yechao She, Jianping Wang:
Progressive Hierarchical Deep Reinforcement Learning for defect wafer test. Knowl. Based Syst. 295: 111832 (2024)

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