"An efficient bi-objective optimization framework for statistical ..."

Xin Li et al. (2016)

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DOI: 10.1631/FITEE.1500168

access: open

type: Journal Article

metadata version: 2022-03-16

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Xin Li, Jin Sun, Fu Xiao, Jiangshan Tian:
An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations. Frontiers Inf. Technol. Electron. Eng. 17(2): 160-172 (2016)

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