"Few-shot defect classification via feature aggregation based on graph ..."

Pengcheng Zhang et al. (2024)

> Home

Details and statistics

DOI: 10.1016/J.JVCIR.2024.104172

access: closed

type: Journal Article

metadata version: 2024-07-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jvcir/ZhangZGC24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jvcir/ZhangZGC24
Pengcheng Zhang, Peixiao Zheng, Xin Guo, Enqing Chen:
Few-shot defect classification via feature aggregation based on graph neural network. J. Vis. Commun. Image Represent. 101: 104172 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.