"Introduction to the Special Issue on Measuring Quality of Experience for ..."

Stefan Winkler et al. (2017)

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DOI: 10.1109/JSTSP.2016.2639779

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type: Journal Article

metadata version: 2023-09-30

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Stefan Winkler, Chang Wen Chen, Alexander Raake, Peter Schelkens, Lea Skorin-Kapov:
Introduction to the Special Issue on Measuring Quality of Experience for Advanced Media Technologies and Services. IEEE J. Sel. Top. Signal Process. 11(1): 3-5 (2017)

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