"A BiCMOS active substrate probe-card technology for digital testing."

Masoud Zargari et al. (1999)

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DOI: 10.1109/4.777110

access: closed

type: Journal Article

metadata version: 2022-07-05

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Masoud Zargari, Justin Leung, S. Simon Wong, Bruce A. Wooley:
A BiCMOS active substrate probe-card technology for digital testing. IEEE J. Solid State Circuits 34(8): 1118-1135 (1999)

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