"A wafer-scale 170000-gate FFT processor with built-in test circuits."

Koichi Yamashita et al. (1988)

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DOI: 10.1109/4.993

access: closed

type: Journal Article

metadata version: 2024-11-05

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Koichi Yamashita, Akinori Kanasugi, Shinpei Hijiya, Gensuke Goto, Nobutake Matsumura, Takehide Shirato:
A wafer-scale 170000-gate FFT processor with built-in test circuits. IEEE J. Solid State Circuits 23(2): 336-342 (1988)

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