"A knowledge-based test generator for standard cell and iterative array ..."

Prab Varma, Yoshihiro Tohma (1988)

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DOI: 10.1109/4.1003

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type: Journal Article

metadata version: 2024-11-05

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Prab Varma, Yoshihiro Tohma:
A knowledge-based test generator for standard cell and iterative array logic circuits. IEEE J. Solid State Circuits 23(2): 428-436 (1988)

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