"A Process-Variation-Tolerant On-Chip CMOS Thermometer for Auto Temperature ..."

Daeyong Shim et al. (2013)

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DOI: 10.1109/JSSC.2013.2272338

access: closed

type: Journal Article

metadata version: 2021-07-25

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Daeyong Shim, Hyunsik Jeong, Hyunjoong Lee, Cyuyeol Rhee, Deog-Kyoon Jeong, Suhwan Kim:
A Process-Variation-Tolerant On-Chip CMOS Thermometer for Auto Temperature Compensated Self-Refresh of Low-Power Mobile DRAM. IEEE J. Solid State Circuits 48(10): 2550-2557 (2013)

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