"A novel transistor model for simulating avalanche-breakdown effects in Si ..."

Matthias Rickelt, Hans-Martin Rein (2002)

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DOI: 10.1109/JSSC.2002.801197

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type: Journal Article

metadata version: 2022-08-16

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Matthias Rickelt, Hans-Martin Rein:
A novel transistor model for simulating avalanche-breakdown effects in Si bipolar circuits. IEEE J. Solid State Circuits 37(9): 1184-1197 (2002)

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