"On-Chip Combined C-V/I-V Characterization System in 45-nm CMOS Technology."

Simeon Realov, Kenneth L. Shepard (2013)

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DOI: 10.1109/JSSC.2013.2237695

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type: Journal Article

metadata version: 2020-08-30

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Simeon Realov, Kenneth L. Shepard:
On-Chip Combined C-V/I-V Characterization System in 45-nm CMOS Technology. IEEE J. Solid State Circuits 48(3): 814-826 (2013)

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