"Simulation and measurement of supply and substrate noise in mixed-signal ICs."

Brian E. Owens et al. (2005)

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DOI: 10.1109/JSSC.2004.841039

access: closed

type: Journal Article

metadata version: 2022-03-02

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Brian E. Owens, Sirisha Adluri, Patrick Birrer, Robert Shreeve, Sasi Kumar Arunachalam, Kartikeya Mayaram, Terri S. Fiez:
Simulation and measurement of supply and substrate noise in mixed-signal ICs. IEEE J. Solid State Circuits 40(2): 382-391 (2005)

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