"Highly testable design of BiCMOS logic circuits."

Mohamed Y. Osman, Mohamed I. Elmasry (1994)

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DOI: 10.1109/4.293112

access: closed

type: Journal Article

metadata version: 2023-05-03

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Mohamed Y. Osman, Mohamed I. Elmasry:
Highly testable design of BiCMOS logic circuits. IEEE J. Solid State Circuits 29(6): 671-678 (1994)

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