"Improvement of soft-error rate in MOS SRAMs."

Shuji Murakami et al. (1989)

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DOI: 10.1109/4.34063

access: closed

type: Journal Article

metadata version: 2024-11-12

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Shuji Murakami, Katsuki Ichinose, Kenji Anami, Shimpei Kayano:
Improvement of soft-error rate in MOS SRAMs. IEEE J. Solid State Circuits 24(4): 869-873 (1989)

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