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"A 6T-SRAM With a Post-Process Electron Injection Scheme That Pinpoints and ..."
Kousuke Miyaji et al. (2013)
- Kousuke Miyaji, Toshikazu Suzuki, Shinji Miyano, Ken Takeuchi:
A 6T-SRAM With a Post-Process Electron Injection Scheme That Pinpoints and Simultaneously Repairs Disturb Fails for 57% Less Read Delay and 31% Less Read Energy. IEEE J. Solid State Circuits 48(9): 2239-2249 (2013)
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