"Voltage-comparator-based measurement of equivalently sampled substrate ..."

Keiko Makie-Fukuda et al. (1996)

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DOI: 10.1109/4.509856

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type: Journal Article

metadata version: 2022-07-18

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Keiko Makie-Fukuda, Takanobu Anbo, Toshiro Tsukada, Tatsuji Matsuura, Masao Hotta:
Voltage-comparator-based measurement of equivalently sampled substrate noise waveforms in mixed-signal integrated circuits. IEEE J. Solid State Circuits 31(5): 726-731 (1996)

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