"Analysis and prevention of DRAM latch-up during power-on."

Young-Hee Kim et al. (1997)

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DOI: 10.1109/4.553181

access: closed

type: Journal Article

metadata version: 2022-07-07

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  - https://dblp.org/rec/journals/jssc/KimSPDPCOOA97
Young-Hee Kim, Jae-Yoon Sim, Hong June Park, Jae-Ik Doh, Kun-Woo Park, Hyun-Woong Chung, Jong-Hoon Oh, Choon-Sik Oh, Seung-Han Ahn:
Analysis and prevention of DRAM latch-up during power-on. IEEE J. Solid State Circuits 32(1): 79-85 (1997)

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