"Design of charge pump circuit with consideration of gate-oxide reliability ..."

Ming-Dou Ker, Shih-Lun Chen, Chia-Sheng Tsai (2006)

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DOI: 10.1109/JSSC.2006.872704

access: closed

type: Journal Article

metadata version: 2021-10-15

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Ming-Dou Ker, Shih-Lun Chen, Chia-Sheng Tsai:
Design of charge pump circuit with consideration of gate-oxide reliability in low-voltage CMOS processes. IEEE J. Solid State Circuits 41(5): 1100-1107 (2006)

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