"High reliability electron-ejection method for high density flash memories."

Takayuki Kawahara et al. (1995)

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DOI: 10.1109/4.482206

access: closed

type: Journal Article

metadata version: 2023-06-26

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Takayuki Kawahara, Naoki Miyamoto, Syun-ichi Saeki, Yusuke Jyouno, Masataka Kato, Katsutaka Kimura:
High reliability electron-ejection method for high density flash memories. IEEE J. Solid State Circuits 30(12): 1554-1562 (1995)

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