"In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and ..."

Yusuke Kanno et al. (2007)

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DOI: 10.1109/JSSC.2007.891662

access: closed

type: Journal Article

metadata version: 2020-08-30

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Yusuke Kanno, Yuki Kondoh, Takahiro Irita, Kenji Hirose, Ryo Mori, Yoshihiko Yasu, Shigenobu Komatsu, Hiroyuki Mizuno:
In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution. IEEE J. Solid State Circuits 42(4): 784-789 (2007)

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