"A 325F2 Physical Unclonable Function Based on Contact Failure ..."

Duhyun Jeon et al. (2023)

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DOI: 10.1109/JSSC.2022.3189351

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type: Journal Article

metadata version: 2023-04-16

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Duhyun Jeon, Dongmin Lee, Dong Kyue Kim, Byong-Deok Choi:
A 325F² Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio. IEEE J. Solid State Circuits 58(4): 1185-1196 (2023)

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