"Design of CMOS circuits for stuck-open fault testability."

Anura P. Jayasumana, Yashwant K. Malaiya, Rochit Rajsuman (1991)

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DOI: 10.1109/4.65711

access: closed

type: Journal Article

metadata version: 2025-02-26

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Anura P. Jayasumana, Yashwant K. Malaiya, Rochit Rajsuman:
Design of CMOS circuits for stuck-open fault testability. IEEE J. Solid State Circuits 26(1): 58-61 (1991)

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