"Development of a new type of self-scanned electron image sensing ..."

John V. Hatfield et al. (1989)

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DOI: 10.1109/4.32029

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type: Journal Article

metadata version: 2024-11-12

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John V. Hatfield, Trevor A. York, John Comer, Peter J. Hicks:
Development of a new type of self-scanned electron image sensing integrated circuit. IEEE J. Solid State Circuits 24(3): 704-710 (1989)

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