"A latch-up-like new failure mechanism for high-density CMOS dynamic RAMs."

Tohru Furuyama et al. (1990)

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DOI: 10.1109/4.50282

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type: Journal Article

metadata version: 2025-01-23

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Tohru Furuyama, Hidemi Ishiuchi, Hiroyasu Tanaka, Yoshihisa Watanabe, Yusuke Kohyama, Tohru Kimura, Kazuyoshi Muraoka, Souichi Sugiura, Kenji Natori:
A latch-up-like new failure mechanism for high-density CMOS dynamic RAMs. IEEE J. Solid State Circuits 25(1): 42-47 (1990)

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