"On fault probabilities and yield models for VLSI neural networks."

Paul M. Furth, Andreas G. Andreou (1997)

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DOI: 10.1109/4.604090

access: closed

type: Journal Article

metadata version: 2022-07-07

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Paul M. Furth, Andreas G. Andreou:
On fault probabilities and yield models for VLSI neural networks. IEEE J. Solid State Circuits 32(8): 1284-1287 (1997)

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