"Content-addressable memory for VLSI pattern inspection."

Soo-Ik Chae et al. (1988)

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DOI: 10.1109/4.259

access: closed

type: Journal Article

metadata version: 2024-11-05

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Soo-Ik Chae, James T. Walker, Chong-Cheng Fu, R. Fabian Pease:
Content-addressable memory for VLSI pattern inspection. IEEE J. Solid State Circuits 23(1): 74-78 (1988)

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