"Measurement of the local latch-up sensitivity by means of ..."

Claudio Canali et al. (1988)

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DOI: 10.1109/4.1027

access: closed

type: Journal Article

metadata version: 2024-12-24

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Claudio Canali, Manuela Giannini, Andrea Scorzoni, Massimo Vanzi, Enrico Zanoni:
Measurement of the local latch-up sensitivity by means of computer-controller scanning electron microscopy. IEEE J. Solid State Circuits 23(2): 597-603 (1988)

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