"Integrated RF components in a SiGe bipolar technology."

Joachim N. Burghartz et al. (1997)

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DOI: 10.1109/4.628759

access: closed

type: Journal Article

metadata version: 2022-07-07

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Joachim N. Burghartz, Mehmet Soyuer, Keith A. Jenkins, Michael Kies, Margaret Dolan, Kenneth J. Stein, John Malinowski, David L. Harame:
Integrated RF components in a SiGe bipolar technology. IEEE J. Solid State Circuits 32(9): 1440-1445 (1997)

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