"Automated defect identification via path analysis-based features with ..."

Yuwei Zhang et al. (2020)

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DOI: 10.1016/J.JSS.2020.110585

access: open

type: Journal Article

metadata version: 2023-03-01

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Yuwei Zhang, Dahai Jin, Ying Xing, Yunzhan Gong:
Automated defect identification via path analysis-based features with transfer learning. J. Syst. Softw. 166: 110585 (2020)

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