"A Test Restoration Method based on Genetic Algorithm for effective fault ..."

Xiaobo Yan, Bin Liu, Shihai Wang (2021)

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DOI: 10.1016/J.JSS.2020.110861

access: closed

type: Journal Article

metadata version: 2022-08-16

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Xiaobo Yan, Bin Liu, Shihai Wang:
A Test Restoration Method based on Genetic Algorithm for effective fault localization in multiple-fault programs. J. Syst. Softw. 172: 110861 (2021)

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