"An analysis of defect densities found during software inspections."

John C. Kelly, Joseph S. Sherif, Jonathan M. Hops (1992)

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DOI: 10.1016/0164-1212(92)90089-3

access: closed

type: Journal Article

metadata version: 2020-02-24

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John C. Kelly, Joseph S. Sherif, Jonathan M. Hops:
An analysis of defect densities found during software inspections. J. Syst. Softw. 17(2): 111-117 (1992)

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