"Fault generation model and mental stress effect analysis."

Tsuneo Furuyama, Yoshio Arai, Kazuhiko Iio (1994)

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DOI: 10.1016/0164-1212(94)90093-0

access: closed

type: Journal Article

metadata version: 2020-02-24

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Tsuneo Furuyama, Yoshio Arai, Kazuhiko Iio:
Fault generation model and mental stress effect analysis. J. Syst. Softw. 26(1): 31-42 (1994)

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