"Microelectronics: Fault tolerance and reliability."

Roberto Negrini (1988)

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DOI: 10.1016/0165-6074(88)90147-0

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type: Journal Article

metadata version: 2022-08-05

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Roberto Negrini:
Microelectronics: Fault tolerance and reliability. Microprocess. Microprogramming 24(1-5): 773 (1988)

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