"An efficient on-chip deterministic test pattern generation scheme."

Aloke K. Das, Parimal Pal Chaudhuri (1989)

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DOI: 10.1016/0165-6074(89)90254-8

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type: Journal Article

metadata version: 2022-08-12

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Aloke K. Das, Parimal Pal Chaudhuri:
An efficient on-chip deterministic test pattern generation scheme. Microprocessing and Microprogramming 26(3): 195-204 (1989)

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